National Instruments has announced the expansion of its line of PXI SMUs for automated semiconductor test. Ideal for parallel testing of multipin semiconductor DUTs, the new NI PXIe-4143 SMU offers 600,000 samples per second and four channels – the highest channel density of any SMU – and expands NI’s multichannel SMU output range to 24 V at 150 mA. Such features help reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of DUTs.
“With the new NI PXIe-4143, our SMU family now gives test engineers DC measurement options for almost any device,” said Ron Wolfe, Vice President of Semiconductor Test at National Instruments. “Our industry-leading channel counts, superior sample rates and SourceAdapt technology for custom tuning, provide one of the most flexible selections of semiconductor measurement instruments available.”
Product Features
· Four SMU channels with up to 600 kS/s sampling rate to measure fast transient responses
· Four-quadrant output capability of 24 V at 150 mA, complementing preexisting NI SMU capabilities for sourcing and sinking
· Measurement sensitivity of 10 pA
· Flexible, compact PXI modular instrumentation architecture for small-footprint equipment deployments
Review – Public ICS Disclosures – Week of 4-20-24 – Part 2
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For Part 2 we have nine additional vendor disclosures from Panasonic, QNAP
(6), WatchGuard, and Welotec. We also have eight vendor updates from
Broadcom ...
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